基礎信(xin)息(xi)Product information

產(chan)品(pin)名(ming)稱(cheng)：Charge Decay Analyser靜電衰(shuai)減分析儀(yi)

產(chan)品(pin)型(xing)號(hao)：

更(geng)新(xin)時間：2025-06-09

產(chan)品(pin)簡(jian)介：

Charge Decay Analyser靜電衰(shuai)減分析儀(yi)，JCI-155靜電衰(shuai)減儀(yi)可(ke)對固體,粉(fen)體和液體材料(liao)進(jin)行(xing)監(jian)測(ce)

產品(pin)特(te)性Product characteristics

JCI155v6  Charge Decay Analyser靜電衰(shuai)減分析儀(yi)
Electrostatic Charge Decay Time Analyser JCI-155v6
JCI-155 靜電衰(shuai)減分析儀(yi)由英國Chilworth公司開發制造. Chilworth是的爆(bao)炸(zha)/燃燒危(wei)害檢測(ce)機構, 同(tong)時也(ye)是(shi)相關專(zhuan)業儀(yi)器(qi)和設備的(de)制造商. JCI-155 靜電衰(shuai)減分析儀(yi)經(jing)歷了3代的(de)發展過程, 從zui初的(de)155v4 到155v5, 型(xing)號(hao)為(wei)155v6.
JCI-155靜電衰(shuai)減儀(yi)可(ke)對固體,粉(fen)體和液體材料(liao)進(jin)行(xing)監(jian)測(ce), 軟(ruan)件(jian)功能強大, 是(shi)美國國家(jia)航空(kong)和宇宙航行(xing)局(NASA)采(cai)用產品(pin). 同(tong)時JCI-155v6衰(shuai)減分析儀(yi)還(hai)是IEC 61340-2-1標(biao)準規範的模(mo)板設(she)備(bei).
JCI 155v6用於測(ce)試材料(liao)的(de)靜電衰(shuai)減時間和(he)電容(rong)負載
可(ke)直(zhi)接將(jiang)JCI 155v6 放置(zhi)在測(ce)試材料(liao)上(shang)測(ce)量
測(ce)量範圍: 10毫秒-99小(xiao)時
測(ce)試反(fan)應時間: 10毫(hao)秒(miao)
測(ce)試電壓(ya)(電暈(yun)放(fang)電): 0-9.9kV(可(ke)以選(xuan)擇正(zheng)負極性(xing))
衰(shuai)減測(ce)試比(bi)例: 1%-99%的衰(shuai)減時間
同(tong)時測(ce)量環境(jing)溫(wen)濕(shi)度(du)
特(te)別(bie)設(she)計氣閘效應, 消(xiao)除(chu)殘(can)留(liu)空(kong)氣離子(zi)幹擾(rao)
高(gao)精度(du)靜電壓(ya)測(ce)試探頭
采(cai)用配套(tao)JCI176樣品(pin)臺(tai)可(ke)測(ce)量轉(zhuan)移到測(ce)試料(liao)樣上的(de)電量(liang), 並(bing)計算(suan)出(chu)電容(rong)負載
采(cai)用配套(tao)JCI173樣品(pin)杯(bei)可(ke)以測(ce)量粉(fen)體和液體的靜電衰(shuai)減期
配(pei)套JCI-Graph軟(ruan)件(jian)在電腦(nao)中儲(chu)存分析數(shu)據(ju),衰(shuai)減曲線和(he)形(xing)成(cheng)報告

品(pin)牌(pai): JCI
制(zhi)造商: Chilworth Technology Ltd
產地: 英國
訂購編(bian)號(hao):     描(miao)述:
JCI155v6     包(bao)含(han)以下(xia)物品(pin)
      測(ce)試儀(yi)
      JCI176樣品(pin)臺(tai), 用於測(ce)試平(ping)面材料(liao), 可(ke)以測(ce)試材料(liao)電荷(he)負載
      JCI173樣品(pin)杯(bei), 用於測(ce)試粉(fen)體和液體
      測(ce)試儀(yi)和(he)樣品(pin)臺(tai)連(lian)接纜(lan)線, 1條
      接地線, 2條
      長USB數(shu)據(ju)線, 1條, 用於連(lian)接儀(yi)器(qi)和電腦(nao)
      短(duan)USB數(shu)據(ju)線, 1條, 用於外(wai)接U盤
      配(pei)套軟(ruan)件(jian)
      校(xiao)正(zheng)書(shu)和(he)說(shuo)明書(shu)

JCI155v6  Charge Decay Analyser靜電衰(shuai)減分析儀(yi)

Two  years  in  development,  JCI  Chilworth  is  proud  to announce  the next  generation of our highly successful electrostatic charge decay analyser, the  JCI  155v6.  A  comprehensive  advance  on  previous  generations of electrostatic decay analyser, we believe this new monitor outperforms all others on the market today.          
            JCI 155v6 - ADVANCES IN USABILITY 
 •    User friendly interface with simple setup of run  parameters and comparative presentation of results  
•     Live, on-instrument display of test results (v5 does not display graphs)  
•    Calculation and display of capacitance loading on the instrument (v5 only via JCI Graph) 
•     Enhanced LCD display with dimmable back light (v5 simple alphanumeric) 
•     Download and display of test descriptions to instrument  (v5 description visible in JCI Graph only) 
•    1024 samples per second rate (v5 = 512 per second) with higher resolution to improve accuracy of results 
  •     Software updates downloadable from the Web 
  •    Driverless USB interface to PC (v5 = serial RS232) 
     •    High resolution 19 bit sampling 

•     Battery life of over 8 hours  (v5 around 4 hours)  
•    Full charge time of 2 hours (v5 4 hours) 
•    Lower power mode, auto power-down and multiple 
run auto-termination options  

NEW JCI 155v6 DESIGN PRINCIPLES 
The JCI 155 charge decay analyser is a sophisticated instrument and the 
culmination of incremental developments carried-out over many years by 
Dr John Chubb and continued by JCI Chilworth. It is designed to achieve 
full functionality independent of a host PC yet can uplink to a PC for test 
data and instrument control. 
Intuitive and portable, the v6t charges in half the time of the v5 (just 2 
hours) and yet has double the battery endurance (8 hours) with the op-tion  to  power  from  mains  supply  also.  The  new  analyser  provides  a 
unique, all-in-one package capable of measuring charge decay times for 
materials as a key indicator of such static problems as: 
 
 JCI155v6  主(zhu)要參(can)數(shu) 
電暈(yun)放(fang)電電壓(ya)：0-9900V（默(mo)認設(she)置(zhi)7000V） 
電暈(yun)放(fang)電時間：0-50ms，以2ms增幅(fu)設(she)置(zhi)（默認設(she)置(zhi)20ms） 
初始(shi)電壓(ya)取值(zhi)時間：0-100ms，以10ms增幅(fu)設(she)置(zhi)（默認設(she)置(zhi)20ms） 
測(ce)試結(jie)束點：可以選(xuan)擇以下(xia)4種(zhong) 
低(di)於+/-2V自動(dong)結(jie)束測(ce)試 
到達1/e 和設置(zhi)的衰(shuai)減百分比（可(ke)設(she)置(zhi)1%-99%），默認設(she)置(zhi)10% 
開始(shi)測(ce)試後1-99h（按(an)1h增幅設(she)置(zhi)） 
手動(dong)停止測(ce)試 
滑(hua)板開(kai)啟並(bing)移動(dong)速度(du)：20ms（快），0.75s（慢(man)） 
 
 
采(cai)用JCI-176樣品(pin)臺(tai)可(ke)以測(ce)量電容(rong)負載（相對電容(rong)） 
測(ce)試固(gu)體材料(liao)時，把(ba)被測(ce)試材料(liao)加(jia)入JCI-176樣品(pin)臺(tai) 
測(ce)試粉(fen)體、液體材料(liao)時，把(ba)JCI-173樣品(pin)杯(bei)夾(jia)入JCI-176樣品(pin)臺(tai) 
The JCI 155v6 is also invaluable for Quality Assurance testing where 
materials  are  intended  to  address  or  control  possible  electrostatic     
problems.  Especially  useful  is  the  ability  to  place  the  unit  onto  the      
surface  to  be  tested.  Using  the  JCI  176  charge  measuring  sample   
support base (included), and other accessories, ensures a wide range 
of  materials  including  textiles,  rubbers,  paper,  plastics,  powders  or       
liquids can be tested to name but a few. 
       material flow issues 
             surface contamination 
 personnel shocks   quality control 
   equipment damage    ignitions   
explosions      low-productivity  

Technology at work for you 
Many  of  the  useful  opportunities    
presented  by  static  electricity,  and 
many of its risks and problems, relate 
to the influence of retained electrostatic charge manifested 
as surface voltage. In the JCI 155v6 Charge Decay Test 
Analyser,  a  high  voltage  corona  discharge  is  used  to       
deposit a patch of charge onto the surface of the material 
to be tested. A fast response electrostatic field-meter then 
measures  the  voltage  generated  by  this  charge  and       
assesses its decay characteristics. 
THE LATEST JCI 155V6 
CHARGE DECAY     
ANALYSER 
 live graphs, 
          user-friendly operation 
A FUSION OF TECHNOLOGY 
Technologies involved in this new-generation analyser include 
the  latest  in  electromechanical  field-mills  giving  highly          
accurate,  sensitive  and  stable  measurement  of  surface        
potential. The JCI 155v6 can operate standalone or can be 
linked to PC providing a fast, flexible and intuitive interface for 
accurate measurements.  
DATA SECURITY 
  
  The JCI 155v6 also offers levels of  data security to provide a 
secure  and  flexible  return  on  your  investment,  whilst  helping 
build your quality and accountability levels 

JCI Chilworth 
Beta House 
Southampton Science  Park 
Chilworth 
Southampton 
United Kingdom 
SO16 7NS 
In  addition,  you  can  request  full 
technical specifications, or contact 
a JCI specialist using the contact 
details on the right. 
We  are  also  running  a  series  of 
online  Webex  launch  events  at  a 
date and time to suit you, contact 
us today for an online invitation. 
JCI Chilworth’s experts are always 
on-hand to answer your 155v6 
questions, or discuss our wider 
range of solutions for electrostatic     
measurement and control. 
ELECTROSTATIC  
PROBLEMS? 
  For details of Chilworth’s 
broad range of further    
electrostatic equipment and 
consultancy, see over.. 
     we look       
forward to being 
of assistance 
As  a  current  or  new  user  of  the  new  
JCI  155v6,  we  are  confident  that  you 
will want to know more about its capa-bilities  and  features  so  have  prepared 
an  exclusive  launch  video  and         
‘step-through’ demonstration of the new         
analyser  on  our  JCI  155v6  dedicated            
microsite, details below - 

Chilworth Global brings together 
leading expert consultants in the field 
of process safety with GLP compliant 
laboratories providing a single point 
of contact for all your process safety 
needs.  
Chilworth’s laboratories determine 
electrostatic  and flammability data 
for materials and undertake chemical 
reaction hazard and regulatory test-ing. Our Consultant Engineers pro-vide expertise in all aspects of elec-trostatics (applications, problems and 
hazards), fire and explosion safety 
and chemical reaction hazards. For 
further information on all our products 
 
JCI Chilworth is our brand name for  
a well established range of electro-static instruments, of which three are          
mentioned below:  
The JCI178 measures small quantities 
of charge and charge transfer in           
electrostatic discharges  
The JCI140 Static Monitor is a hand-held proximity voltmeter used in many 
industries and by electrostatic         
professionals. 
The JCI131 is an electric field meter 
suitable for use in adverse conditions, 
including long-term monitoring        
outdoors.   
We also offer a range of optional ac-cessories, consultancy and calibration 
services which enhance and expand  
this most comprehensive and excep-tional range of quality instrumentation. 

JCI155v6  性(xing)能優點
JCI-155v6靜電分析儀(yi)是(shi)IEC 61340-2-1規範所采(cai)用的*設(she)備(bei) 
JCI-155v6靜電分析儀(yi)式是美國國家(jia)航空(kong)和宇宙航行(xing)局（NASA）采(cai)用產品(pin) 
 
JCI-155v6是(shi)壹(yi)款(kuan)小(xiao)巧(qiao)輕(qing)便(bian)的(de)測(ce)試儀(yi)器(qi)，采(cai)用電暈(yun)放(fang)電方(fang)式施(shi)加電荷(he)到被測(ce)材料(liao)表(biao)面，可(ke)以快速、精確地測(ce)量材料(liao)的(de)靜電消(xiao)散能力(li)和評估(gu)壹(yi)定數(shu)量的(de)電荷(he)轉(zhuan)移到材料(liao)上(shang)時，是(shi)否(fou)會產(chan)生(sheng)明顯的靜電位。 
 
JCI-155v6主(zhu)要由電壓(ya)計(ji)、電暈(yun)放(fang)電裝(zhuang)置(zhi)、計時器(qi)、機械(xie)運動(dong)結(jie)構、內(nei)部處理器和儲存器(qi)構成(cheng)。高(gao)壓電暈(yun)放(fang)電施(shi)加電荷(he)到測(ce)試料(liao)樣表(biao)面，電壓(ya)計(ji)對表(biao)面電壓(ya)進(jin)行測(ce)量，計(ji)時器(qi)對(dui)過程計(ji)時，所(suo)有(you)過程由內部處理器控(kong)制(zhi)及處理數(shu)據(ju)。 
 
所有(you)的操(cao)作和(he)數(shu)據(ju)處理都由JCI-155v6的處理器和軟(ruan)件(jian)完(wan)成(cheng)，通過5個多(duo)功能按(an)鍵來進(jin)行人(ren)機交(jiao)互。測(ce)試測(ce)試數(shu)據(ju)保存在儀(yi)器(qi)內存中(zhong)，可以通過(guo)USB接口輸出(chu)到個人(ren)電腦(nao)。 
 
儀(yi)器(qi)本身大屏幕LCD可(ke)以顯示測(ce)試讀(du)數(shu)和曲線圖(tu)。采(cai)用USB連接線連(lian)接個人(ren)電腦(nao)後，通過配套(tao)JCI-Graph軟(ruan)件(jian)可(ke)以在電腦(nao)端(duan)控(kong)制(zhi)儀(yi)器(qi)，設置(zhi)測(ce)試參(can)數(shu)。所有(you)數(shu)據(ju)可以輸出(chu)到電腦(nao)並保(bao)存為(wei)表(biao)單(dan)文(wen)件(jian)，測(ce)試數(shu)據(ju)和圖(tu)形(xing)可(ke)以直接打(da)印，復制粘(zhan)貼(tie)到其他應用程序(xu)（例如WORD）。 
 
配(pei)套(tao)JCI-176樣品(pin)臺(tai)提(ti)供壹個標(biao)準的測(ce)試平(ping)臺(tai)，可(ke)以方便(bian)地固定(ding)被測(ce)材料(liao)。JCI-176還(hai)可(ke)以測(ce)試材料(liao)所(suo)獲(huo)得(de)的(de)電荷(he)量(liang)，進而計算(suan)電容(rong)負載。在JCI-176樣品(pin)臺(tai)的(de)基礎上加(jia)上(shang)JCI-173樣品(pin)杯(bei)可(ke)以測(ce)試粉(fen)體和液體。 
 
JCI-155v6采(cai)用特(te)殊(shu)結(jie)構，不(bu)同於傳(chuan)統的靜電衰(shuai)減監(jian)測(ce)儀(yi)。傳(chuan)統的靜電衰(shuai)減監(jian)測(ce)儀(yi)要求把(ba)被測(ce)試材料(liao)按(an)規定尺寸(cun)切(qie)割(ge)後放置(zhi)在壹(yi)個旋(xuan)轉(zhuan)的接地平(ping)臺(tai)上(shang)，被測(ce)試材料(liao)周(zhou)期(qi)性(xing)的經過，電壓(ya)探頭下(xia)方，以此來周(zhou)期性的(de)獲(huo)取信(xin)號(hao)來計(ji)算(suan)衰(shuai)減特(te)性。 
 
JCI-155v6采(cai)用旋(xuan)轉(zhuan)葉片式電壓(ya)探頭，這(zhe)樣可以直接周(zhou)期性(xing)的(de)獲(huo)取信(xin)號(hao)，被測(ce)試料(liao)樣不(bu)用特(te)殊(shu)處理，也不(bu)需要運動(dong)。因(yin)此JCI-155v6的(de)整體結(jie)構更(geng)加緊密(mi)輕(qing)巧(qiao)，可(ke)以直接放(fang)置(zhi)在被測(ce)材料(liao)上(shang)進(jin)行(xing)測(ce)試。